Electron Microscopy

SEM based mineralogical characterization of primary and secondary ores

A latest-generation electron microscope (Zeiss Sigma 300) equipped with 2 EDX Bucker detectors provides liberation and mineral mass balance analysis using the mineralogical software.

Zeiss Sigma 300 FEG  Mineral mapping

– Mineral Mass balance

– Liberation

– Impact of mineralogical features (size, textures, mineralogy) on process efficiency

– 2 Brucker EDX detector

– micro-focused X-ray source

– Mineralogic mining software

Contact : hassan.bouzahzah@ULiege